发明名称 MANUFACTURING METHOD AND MANUFACTURING DEVICE FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device, capable of sufficiently filling even a gap between semiconductor chips at the highest position with an underfill material even when the number of semiconductor chip laminates increases, and a manufacturing device used for the same.SOLUTION: A method for manufacturing a semiconductor device according to an embodiment comprises the steps of: (a) laminating a plurality of semiconductor elements on a substrate in multiple stages; (b) holding the substrate horizontally and arranging an underfill material around the semiconductor elements laminated on the horizontally held substrate; (c) inclining the substrate on which the semiconductor elements are laminated so that the underfill material arranged around the semiconductor elements is located at least above the substrate; (d) heating the underfill material and filling a gap between the inclined substrate and the semiconductor element laminated on the substrate and a gap between the laminated semiconductor elements with the heated underfill material; and (e) curing the filled underfill material.
申请公布号 JP2013157521(A) 申请公布日期 2013.08.15
申请号 JP20120018208 申请日期 2012.01.31
申请人 TOSHIBA CORP 发明人 WATABE HIROSHI
分类号 H01L21/56;H01L25/065;H01L25/07;H01L25/18 主分类号 H01L21/56
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