发明名称 BULK FIN-FIELD EFFECT TRANSISTORS WITH WELL DEFINED ISOLATION
摘要 A fin field-effect-transistor fabricated by forming a dummy fin structure on a semiconductor substrate. A dielectric layer is formed on the semiconductor substrate. The dielectric layer surrounds the dummy fin structure. The dummy fin structure is removed to form a cavity within the dielectric layer. The cavity exposes a portion of the semiconductor substrate thereby forming an exposed portion of the semiconductor substrate within the cavity. A dopant is implanted into the exposed portion of the semiconductor substrate within the cavity thereby creating a dopant implanted exposed portion of the semiconductor substrate within the cavity. A semiconductor layer is epitaxially grown within the cavity atop the dopant implanted exposed portion of the semiconductor substrate.
申请公布号 US2013210206(A1) 申请公布日期 2013.08.15
申请号 US201313852428 申请日期 2013.03.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHENG KANGGUO;HARAN BALASUBRAMANIAN S.;PONOTH SHOM;STANDAERT THEODORUS E.;YAMASHITA TENKO
分类号 H01L29/66 主分类号 H01L29/66
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