发明名称 DIFFERENTIAL PHASE-CONTRAST IMAGING
摘要 The present invention relates to differential phase-contrast imaging, in particular to a structure of a diffraction grating, e.g. an analyzer grating and a phase grating, for X-ray differential phase-contrast imaging. In order to make better use of the X-ray radiation passing the object, a diffraction grating (14) for X-ray differential phase-contrast imaging is provided with at least one portion (24) of a first sub-area (26) and at least one portion (28) of a second sub-area (30). The first sub-area comprises a grating structure (54) with a plurality of bars (34) and gaps (36) being arranged periodically with a first grating pitch P G (38), wherein the bars are arranged such that thy change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The second sub-area is X-ray transparent and wherein the at least one portion of the second sub-area provides an X-ray transparent aperture (40) in the grating. Portions of the first and second sub-areas are arranged in an alternating manner in at least one direction (42).
申请公布号 US2013208864(A1) 申请公布日期 2013.08.15
申请号 US201113878767 申请日期 2011.10.12
申请人 ROESSL EWALD;KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 ROESSL EWALD
分类号 G21K1/06;G01N23/04;G01T7/00 主分类号 G21K1/06
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