发明名称 |
METHODS AND SYSTEMS FOR ANALYZING SAMPLES |
摘要 |
This disclosure relates to a method for analyzing a sample of material. The method includes (a) converting a portion of the sample into a plasma multiple times; (b) recording a spectrum of electromagnetic radiation emitted in response to each of the sample conversions to define a sequence of spectra for the sample, in which each member of the sequence corresponds to the spectrum recorded in response to a different one of the sample conversions; (c) using an electronic processor to compare the sequence of spectra for the sample to a sequence of spectra for each of at least one reference sample in a reference library; and (d) using the electronic processor to determine information about the sample based on the comparison to the reference samples in the library |
申请公布号 |
WO2013119604(A1) |
申请公布日期 |
2013.08.15 |
申请号 |
WO2013US24843 |
申请日期 |
2013.02.06 |
申请人 |
MATERIALYTICS, LLC |
发明人 |
MCMANUS, CATHERINE E.;DOWE III, JAMES W.;LIKES, TRISTAN M.;DOWE IV, JAMES W. |
分类号 |
G01N21/71 |
主分类号 |
G01N21/71 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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