发明名称 IMAGE INSPECTION METHOD AND IMAGE INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a technology which automatically sets an area of inspection adaptively and performs highly accurate inspection even when there is an individual difference in an object to be inspected, or a position and direction of the object to be inspected are uncertain.SOLUTION: A parameter used as a constraint condition in optimum solution search processing is given to an image inspection device as inspection area definition information. In inspecting an object to be inspected, the image inspection device uses the inspection area definition information as a constraint condition and obtains an optimum solution of an inspection area from an image of the object to be inspected. Thus, a position and a shape of the inspection area are individually determined for every object to be inspected.
申请公布号 JP2013156094(A) 申请公布日期 2013.08.15
申请号 JP20120015810 申请日期 2012.01.27
申请人 OMRON CORP 发明人 MINATO YOSHIHISA;YANAGAWA YUKIKO
分类号 G01N21/88;G06T1/00;G06T7/60 主分类号 G01N21/88
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