INTEGRATED CIRCUIT DEVICE AND TEST METHOD

摘要

PROBLEM TO BE SOLVED: To provide an integrated circuit device for suppressing skew and jitter of a clock signal.SOLUTION: An integrated circuit device 400A includes a chip 100A and a package substrate 410A. The chip 100A includes a clock driver 150 for outputting a clock signal and a clock receiver 160 for receiving the clock signal. The package substrate 410A includes: a clock signal line 420 which transmits the clock signal outputted from the clock driver 150; and a power source line 430 and a ground line 440 which directly supply electric power to the clock driver 150 and the clock receiver 160.