发明名称 SHEET INSPECTION DEVICE, MANUFACTURING SYSTEM OF SHEET, AND PACKAGING SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an inspection device 1 for easily inspecting an overlapping state of a sheet where a plurality of films 35a and 34 are layered.SOLUTION: The inspection device 1 where the plurality of films 35a and 34 of different size are layered has: an illumination part 4 for irradiating the sheet with illumination light 4a; a polarizer 5 for polarizing and transmitting the illumination light 4a; and an analyzer 6 for polarizing and transmitting the illumination light 4a that has transmitted the polarizer 5 and the sheet. On the basis of luminance or color of the illumination light 4a transmitting the analyzer 6, an overlapping state of the films 35a and 34 is inspected. Moreover, the inspection device has an imaging part 8 for imaging the illumination light 4a transmitting the analyzer 6 as an image of the sheet and a detection part 9 for detecting a bad quality of the sheet according to the overlapping state of the films 35a and 34 based on the luminance or color of the image of the sheet.
申请公布号 JP2013156064(A) 申请公布日期 2013.08.15
申请号 JP20120015238 申请日期 2012.01.27
申请人 HITACHI INFORMATION & CONTROL SOLUTIONS LTD 发明人 KOFUNE KUNITOMO
分类号 G01N21/892;A23L7/10;G01N21/88 主分类号 G01N21/892
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