发明名称 Method and Apparatus for Adjusting Drain Bias of A Memory Cell With Addressed and Neighbor Bits
摘要 The storage layer such as a nitride layer of a nonvolatile memory cell has two storage parts storing separately addressable data, typically respectively proximate to the source terminal and the drain terminal. The applied drain voltage while sensing the data of one of the storage parts depends on the data stored at the other storage part. If the data stored at the other storage part is represented by a threshold voltage exceeding a minimum threshold voltage, then the applied drain voltage is raised. This technology is useful in read operations and program verify operations to widen the threshold voltage window.
申请公布号 US2013208552(A1) 申请公布日期 2013.08.15
申请号 US201213372135 申请日期 2012.02.13
申请人 CHEN HAN-SUNG;CHEN CHUNG-KUANG;HUNG CHUN-HSIUNG;MACRONIX INTERNATIONAL CO., LTD. 发明人 CHEN HAN-SUNG;CHEN CHUNG-KUANG;HUNG CHUN-HSIUNG
分类号 G11C7/00 主分类号 G11C7/00
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