An electron microscope (11) is provided. In another aspect, an electron microscope (11) employs a radio frequency which acts upon electrons used to assist in imaging a specimen. Furthermore, another aspect provides an electron beam microscope (11) with a time resolution of less than 1 picosecond with more than 105 electrons in a single shot or image group. Yet another aspect employs a super-cooled component (61) in an electron microscope (11).
