发明名称 BIT INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a bit inspection method capable of easily moving an ultrasonic probe and performing flaw detection with equivalent precision over the whole flaw detection surface.SOLUTION: A bit inspection method comprises: a preparation step of preparing a carbide tip sample 15 simulating an actually used carbide tip 10, by formation with the same material or the like; a sample inspection step of performing an ultrasonic flaw inspection on a back face 17 of the carbide tip sample 15 regarded as a flaw detection surface; a reference echo value selection step of selecting a reference echo value on the basis of echo values obtained in the sample inspection step; a correction coefficient calculation step of calculating a correction coefficient by dividing the reference echo value by the echo value; an ultrasonic flaw inspection step for performing an ultrasonic flaw inspection on a brazed surface 3, of an actually used bit 1, regarded as a flaw detection surface; a correction step of calculating a corrected echo value by multiplying a measured echo value at each measurement point P obtained in the ultrasonic flaw inspection step by a corresponding correction coefficient; and a determination step of determining whether a brazing state is good or bad based on the corrected echo value.
申请公布号 JP2013156031(A) 申请公布日期 2013.08.15
申请号 JP20120014437 申请日期 2012.01.26
申请人 TAISEI CORP;MARUWA GIKEN:KK;INSTITUTE OF NATIONAL COLLEGES OF TECHNOLOGY JAPAN 发明人 TAKAKURA KATSUHIKO;MORITA TAIJI;KAYA FUMITAKA;SASAKI MAKOTO;IWAMOTO TATSUYA
分类号 G01N29/04;G01N29/30 主分类号 G01N29/04
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