发明名称 CIRCUIT BOARD FOR SEMICONDUCTOR DEVICE INSPECTION APPARATUS AND MANUFACTURING METHOD THEREOF
摘要 A circuit board for a semiconductor device inspection apparatus can have a small thermal expansion coefficient and high mechanical strength and can be easily manufactured with a reduced manufacturing cost. Furthermore, the circuit board includes a metal base body obtained by stacking and bonding a multiple number of metal plates, each having a through hole formed by an etching, such that the through holes of the metal plates are overlapped with each other to form a through hole; a resin layer formed on surfaces of the metal base body and on an inner wall surface of the through hole of the metal base body; and a conductor pattern formed to be electrically insulated from the metal base body by the resin layer.
申请公布号 US2013206460(A1) 申请公布日期 2013.08.15
申请号 US201313763781 申请日期 2013.02.11
申请人 TOKYO ELECTRON LIMTED;TOKYO ELECTRON LIMTED 发明人 MOCHIZUKI JUN;HOSAKA HISATOMI;HOSHINO TOMOHISA
分类号 H05K1/05;H05K3/44 主分类号 H05K1/05
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