发明名称 Supressing Leakage Currents in a Multi - TFT Device
摘要 A technique of operating a device comprising a patterned conductor layer defining source electrode circuitry and drain electrode circuitry for a plurality of transistors; a semiconductor layer providing a respective semiconductor channel for each transistor between source electrode circuitry and drain electrode circuitry; and gate electrode circuitry overlapping the semiconductor channels of the plurality of transistor devices for switching the semiconductor channels between two or more levels of conductance; wherein the technique comprises using one or more further conductors independent of said gate electrode circuitry to capacitatively induce a reduction in conductivity of said one or more areas of said semiconductor layer outside of said semiconductor channels.
申请公布号 GB201311772(D0) 申请公布日期 2013.08.14
申请号 GB20130011772 申请日期 2013.07.01
申请人 PLASTIC LOGIC LIMITED 发明人
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