发明名称 Interface Engineering to Optimize Metal III-V contacts in FET devices
摘要 <p>Techniques for fabricating self-aligned contacts in III-V FET devices are provided. A method for fabricating a self-aligned contact to III-V materials includes the steps of depositing at least one metal on a surface of a III-V material 102, the metal is reacted with an upper portion of the III-V material to form a metal III-V alloy layer 106 which is the self-aligned contact, an etch is used to remove any unreacted portions of the metal, at least one impurity is implanted into the metal III-V alloy layer, the impurity implanted into the metal III-V alloy layer is diffused to an interface between the metal III-V alloy layer and the III-V material to reduce the contact resistance of the self-aligned contact. The reaction may involve an annealing step.</p>
申请公布号 GB2499318(A) 申请公布日期 2013.08.14
申请号 GB20130002000 申请日期 2013.02.05
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ZHEN ZHANG;YANNING SUN;PAUL MICHAEL SOLOMON;CHRISTIAN LAVOIE;UZMA RANA;KUEN-TING SHIU;DEVENDRA K SADANA
分类号 H01L21/24;H01L21/18;H01L21/441;H01L29/08;H01L29/66 主分类号 H01L21/24
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