| 摘要 |
PURPOSE: A probe pin and a method for manufacturing the same are provided to omit a separate metal layer for an electroplating method by forming a probe tip manufactured by the chemical reaction of a seed layer, and to simplify a process. CONSTITUTION: A base substrate including a probe tip region and a probe beam region is provided. A first photoresist pattern layer is formed on the front surface of a base substrate except the probe tip region and the probe beam region. A first metal layer(230) is formed in the probe tip region and the probe beam region. The first metal layer comprises a probe tip(230a) and a first probe beam(230b). A second photoresist pattern layer for exposing the probe tip region and the probe beam region is formed. A second metal layer(251a,251b) is formed in the exposed probe tip region and the probe beam region. |
