发明名称 SEMICONDUCTOR DEVICE STRUCTURE AND METHOD OF MANUFACTURE THEREOF
摘要 <p>A semiconductor device structure comprising a first bulk crystal semiconductor material and a second bulk crystal semiconductor material provided on a surface of the first bulk crystal semiconductor material with or without a deliberate intermediate region, the second bulk crystal semiconductor material being a Group II-VI material dissimilar to the first bulk crystal semiconductor material, wherein portions of the first and/or second bulk crystal semiconductor material have been selectively removed to produce a patterned area of reduced thickness of the first and/or second bulk crystal semiconductor and preferably to expose a patterned area of the said surface of the first and/or second bulk crystal semiconductor material.</p>
申请公布号 EP2162924(B1) 申请公布日期 2013.08.14
申请号 EP20080762623 申请日期 2008.06.30
申请人 KROMEK LIMITED 发明人 BASU, ARNAB;ROBINSON, MAX
分类号 H01L31/0336;H01L31/0352;H01L31/18 主分类号 H01L31/0336
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