发明名称 Delay locked loop circuit and semiconductor integrated circuit device
摘要 <p>A technology capable of avoiding malfunction of a delay locked loop without generating a constant phase error in a delay locked loop circuit is provided. In a delay locked loop circuit, a control circuit is disposed in the outside of a delay locked loop, and in phase comparison of the delay locked loop, the control circuit outputs a control signal to the delay locked loop so that the relation in the phase comparison between a reference signal and an output signal is shifted by a set cycle.</p>
申请公布号 EP1835623(B1) 申请公布日期 2013.08.14
申请号 EP20070000456 申请日期 2007.01.10
申请人 RENESAS ELECTRONICS CORPORATION 发明人 KAWAMOTO, TAKASHI
分类号 H03L7/081;H03K5/13 主分类号 H03L7/081
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