发明名称 DEVICE FOR MONITORING THICKNESS REDUCTION OF INNER SURFACE IN HEAT TRANSFER PIPE OR INNER SURFACE IN EVAPORATION PIPE
摘要 A device (10) for monitoring a thickness reduction of an inner surface in a heat transfer tube or an inner surface in an evaporation tube is a device for monitoring a thickness reduction of an inner surface in a heat transfer tube or an inner surface in an evaporation tube, the device including: a movement unit (12) which moves along a fin tube (11) of the inner surface in the heat transfer tube or the inner surface in the evaporation tube; a laser measurement unit (13) which is provided in the movement unit (12) and measures the thickness reduction of the inner surface in the heat transfer tube or the inner surface in the evaporation tube by a laser; a cable (14) which includes a light guiding path for introducing a laser into the laser measurement unit (13) and a light deriving path for transmitting reflected light; and a thickness reduction determining unit which compares the laser measurement data with past data or standard data and determines the current thickness reduction.
申请公布号 EP2626624(A1) 申请公布日期 2013.08.14
申请号 EP20110830544 申请日期 2011.09.29
申请人 MITSUBISHI HEAVY INDUSTRIES, LTD. 发明人 IKEDA, TETSUYA;KAGAWA, SEIJI;OKINO, SUSUMU;OKAMOTO, TAKUYA
分类号 F22B37/02;F22B37/00;G01B11/06;G01B11/24 主分类号 F22B37/02
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