发明名称 System and method for optically measuring a parameter of an object
摘要 A system and method for optically measuring a parameter of an object uses a first segment of the object captured as a first frame of image data using a first imaging region of an image sensor array and a second segment of the object as a second frame of image data using a second imaging region of the image sensor array, which is larger than the first imaging region, to determine a displaced distance of the object relative to the image sensor array.
申请公布号 US8509487(B2) 申请公布日期 2013.08.13
申请号 US20070737234 申请日期 2007.04.19
申请人 LIM TENG HUN;SAXENA KULDEEP KUMAR;TAN MENG WHUI;AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. 发明人 LIM TENG HUN;SAXENA KULDEEP KUMAR;TAN MENG WHUI
分类号 G06K9/00 主分类号 G06K9/00
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