发明名称 Semiconductor device and manufacturing method thereof
摘要 A semiconductor device and a manufacturing method thereof are disclosed. The method comprises: providing a substrate with a first dielectric layer and a gate, wherein the gate is embedded in the first dielectric layer and an upper portion of the gate is an exposed first metal; and covering only the exposed first metal with a conductive material that is harder to be oxidized than the first metal by a selective deposition. An advantage of the present invention is that the metal of the upper surface of the gate is prevented from being oxidized by covering the metal gate with the conductive material that is relatively harder to be oxidized, thereby facilitating the formation of an effective electrical connection to the gate.
申请公布号 US8507379(B2) 申请公布日期 2013.08.13
申请号 US201113240820 申请日期 2011.09.22
申请人 ZHANG YIYING;HE QIYANG;SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION 发明人 ZHANG YIYING;HE QIYANG
分类号 H01L21/44;H01L21/441;H01L23/48 主分类号 H01L21/44
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