发明名称 Method of forming a semiconductor device having a cut-way hole to expose a portion of a hardmask layer
摘要 A method of forming a semiconductor device having a substrate, an active region and an inactive region includes: forming a hardmask layer over the substrate; transferring a first pattern into the hardmask layer in the active region of the semiconductor device; forming one or more fills in the inactive region; forming a cut-away hole within, covering, or partially covering, the one or more fills to expose a portion of the hardmask layer, the exposed portion being within the one or more fills; and exposing the hardmask layer to an etchant to divide the first pattern into a second pattern including at least two separate elements.
申请公布号 US8507346(B2) 申请公布日期 2013.08.13
申请号 US20100949148 申请日期 2010.11.18
申请人 BURKHARDT MARTIN;COLBURN MATTHEW E.;GABOR ALLEN H.;GLUSCHENKOV OLEG;HALLE SCOTT D.;LANDIS HOWARD S.;WANG HELEN;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BURKHARDT MARTIN;COLBURN MATTHEW E.;GABOR ALLEN H.;GLUSCHENKOV OLEG;HALLE SCOTT D.;LANDIS HOWARD S.;WANG HELEN
分类号 H01L21/336;H01L21/302;H01L21/311;H01L21/3205;H01L21/338;H01L21/461;H01L21/4763;H01L21/8234;H01L21/84 主分类号 H01L21/336
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