发明名称 Semiconductor wafer, semiconductor device, and method for producing semiconductor wafer
摘要 To improve the flatness of the surface and improve the reliability of a semiconductor device when expitaxially growing semiconductor crystal layers of different types on a single silicon wafer, provided is a semiconductor wafer which includes: a base wafer having a silicon crystal in the surface thereof, the silicon crystal having a first dent and a second dent; a first Group IVB semiconductor crystal located in the first dent and exposed; a second Group IVB semiconductor crystal located in the second dent; and a Group III-V compound semiconductor crystal located above the second Group IVB semiconductor crystal in the second dent and exposed.
申请公布号 US8507952(B2) 申请公布日期 2013.08.13
申请号 US201213495746 申请日期 2012.06.13
申请人 YAMANAKA SADANORI;TAKADA TOMOYUKI;HATA MASAHIKO;SUMITOMO CHEMICAL COMPANY, LIMITED 发明人 YAMANAKA SADANORI;TAKADA TOMOYUKI;HATA MASAHIKO
分类号 H01L21/02 主分类号 H01L21/02
代理机构 代理人
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