发明名称 Semiconductor device manufacturing method thereof
摘要 Cutting work is performed on an n-semiconductor substrate (1) with an inverted trapezoid-shaped dicing blade to form grooves to be a second side walls (7). Bottom portions of the grooves are contacted with a p-diffusion layer (4) which is formed on a first principal plane (2) (front face) of the n-semiconductor substrate (1), so that the p-diffusion layer (4) is not cut. Then in the second side walls (7), a p-isolation layer (9) connected to a p-collector layer (8) and the p-diffusion layer (4) is formed. Since the p-diffusion layer (4) is not cut, a glass support substrate for supporting a wafer, and expensive adhesive, are not required, and therefore the p-isolation layer (4) can be formed at low cost.
申请公布号 US8507327(B2) 申请公布日期 2013.08.13
申请号 US20090989226 申请日期 2009.05.13
申请人 TSUKAMOTO YASUHIKO;SHIMOYAMA KAZUO;FUJI ELECTRIC CO., LTD. 发明人 TSUKAMOTO YASUHIKO;SHIMOYAMA KAZUO
分类号 H01L21/332 主分类号 H01L21/332
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