发明名称 METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for manufacturing a silicon carbide semiconductor device is provided to stably manufacture the silicon carbide semiconductor device with constant electrical features by suppressing damage on the interface of metal and silicon carbide. CONSTITUTION: A pair of electrodes are composed of an anode (22) and a cathode (21). A target (23) is made of metal materials. A metal layer is formed on a silicon carbide base (10) by sputtering the target. The incident energy of a sputtering gas and the metal materials on the silicon carbide base is smaller than the combination energy of the silicon carbide. A high frequency voltage applied between the electrodes is 20 to 300V.</p>
申请公布号 KR20130089188(A) 申请公布日期 2013.08.09
申请号 KR20130008381 申请日期 2013.01.25
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 CHIKAMORI DAISUKE;NISHIO YASUHIKO;YUTANI NAOKI
分类号 H01L29/872 主分类号 H01L29/872
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