发明名称 OXIDE FOR SEMICONDUCTOR LAYER OF THIN-FILM TRANSISTOR, SEMICONDUCTOR LAYER OF THIN-FILM TRANSISTOR HAVING THE SAME, AND THIN-FILM TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide an oxide thin film for a semiconductor layer of a thin-film transistor which offers a good switching characteristic, and enables the sputtering at a high sputtering rate, and the wet etching without producing no residue.SOLUTION: The oxide for a thin-film transistor is an In-Zn-Sn-based oxide which comprises at least indium, zinc and tin. The following inequalities (2) and (4) are satisfied when In/(In+Sn)≤0.5; and the inequalities (1), (3) and (4) are satisfied when In/(In+Sn>0.5, where Zn, Sn and In denote contents (atom%) of the metal elements in the oxide: In/(In+Zn+Sn)≤0.3 (1); In/(In+Zn+Sn)≤1.4×{Zn/(Zn+Sn)}-0.5 (2); Zn/(In+Zn+Sn)≤0.83 (3); and 0.1≤In/(In+Zn+Sn) (4).
申请公布号 JP2013153118(A) 申请公布日期 2013.08.08
申请号 JP20120050855 申请日期 2012.03.07
申请人 KOBE STEEL LTD;SAMSUNG DISPLAY CO LTD 发明人 TAO HIROAKI;MIKI AYA;MORITA SHINYA;YASUNO SATOSHI;KUGIMIYA TOSHIHIRO;PARK JAE-WOO;LEE SEIKUN;AHN BYUNG-DU;KIM KEON-HEE
分类号 H01L29/786;C23C14/08;H01L21/203;H01L21/336 主分类号 H01L29/786
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