发明名称 |
OXIDE FOR SEMICONDUCTOR LAYER OF THIN-FILM TRANSISTOR, SEMICONDUCTOR LAYER OF THIN-FILM TRANSISTOR HAVING THE SAME, AND THIN-FILM TRANSISTOR |
摘要 |
PROBLEM TO BE SOLVED: To provide an oxide thin film for a semiconductor layer of a thin-film transistor which offers a good switching characteristic, and enables the sputtering at a high sputtering rate, and the wet etching without producing no residue.SOLUTION: The oxide for a thin-film transistor is an In-Zn-Sn-based oxide which comprises at least indium, zinc and tin. The following inequalities (2) and (4) are satisfied when In/(In+Sn)≤0.5; and the inequalities (1), (3) and (4) are satisfied when In/(In+Sn>0.5, where Zn, Sn and In denote contents (atom%) of the metal elements in the oxide: In/(In+Zn+Sn)≤0.3 (1); In/(In+Zn+Sn)≤1.4×{Zn/(Zn+Sn)}-0.5 (2); Zn/(In+Zn+Sn)≤0.83 (3); and 0.1≤In/(In+Zn+Sn) (4). |
申请公布号 |
JP2013153118(A) |
申请公布日期 |
2013.08.08 |
申请号 |
JP20120050855 |
申请日期 |
2012.03.07 |
申请人 |
KOBE STEEL LTD;SAMSUNG DISPLAY CO LTD |
发明人 |
TAO HIROAKI;MIKI AYA;MORITA SHINYA;YASUNO SATOSHI;KUGIMIYA TOSHIHIRO;PARK JAE-WOO;LEE SEIKUN;AHN BYUNG-DU;KIM KEON-HEE |
分类号 |
H01L29/786;C23C14/08;H01L21/203;H01L21/336 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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