发明名称 DRYING APPARATUS WITH EXHAUST CONTROL CAP FOR SEMICONDUCTOR WAFERS AND ASSOCIATED METHODS
摘要 A drying apparatus for drying a semiconductor wafer includes a processing chamber including a rinsing section and a drying section adjacent thereto. The rinsing section has a chamber loading slot associated therewith for receiving the semiconductor wafer. The drying section has a chamber unloading slot associated therewith for outputting the semiconductor wafer. An exhaust control cap is carried by the processing chamber and includes a bottom wall, a top wall, at least one intermediate wall between the bottom and top walls, and a side wall coupled to the top, bottom and the at least one intermediate wall to define stacked exhaust sections. The exhaust control cap has a cap loading slot aligned with the chamber loading slot, a cap unloading slot aligned with the chamber unloading slot, and at least one exhaust port configured to be coupled to a vacuum source.
申请公布号 US2013199580(A1) 申请公布日期 2013.08.08
申请号 US201213365401 申请日期 2012.02.03
申请人 ZHANG JOHN H.;STMICROELECTRONICS, INC. 发明人 ZHANG JOHN H.
分类号 B08B3/00;B23P17/00;F03B11/02 主分类号 B08B3/00
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