发明名称 FILM FORMATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a film formation method which improves controllability and uniformity of the additive amount.SOLUTION: A film formation apparatus includes: a rotation table on which multiple wafers are placed; a first reaction gas supply region and a second reaction gas supply region which are defined above the rotation table; and a separation region separating the first reaction gas supply region from the second reaction gas supply region. A film formation method used in the film formation apparatus includes steps of: supplying a first reaction gas to the first reaction gas supply region without supplying a reaction gas to the second reaction gas supply region and exposing a wafer to the first reaction gas by rotations of the rotation table thereby causing a wafer surface to absorb the gas; and supplying a second reaction gas to the second reaction gas supply region without supplying the reaction gas to the first reaction gas supply region following the previous step and exposing the wafer to the second reaction gas by the rotations of the rotation table thereby causing the first reaction gas absorbed by the wafer surface to react with the second reaction gas. The above object is achieved by the film formation method.
申请公布号 JP2013153143(A) 申请公布日期 2013.08.08
申请号 JP20120267567 申请日期 2012.12.06
申请人 TOKYO ELECTRON LTD 发明人 FURUYA HARUHIKO;OGAWA ATSUSHI;UENISHI MASAHIKO;ISE MASAYUKI;ENOKI MIKI
分类号 H01L21/31;C23C16/40;C23C16/455;H01L21/316 主分类号 H01L21/31
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