发明名称 MANUFACTURING METHOD OF MEMORY CAPACITOR WITHOUT MOAT STRUCTURE
摘要 A manufacturing method of a memory capacitor without a moat structure includes the steps of: providing a semiconductor substrate defined with an array region and a peripheral region; forming a first oxidized layer on the array region; forming a second oxidized layer on the peripheral region; planarizing the first and the second oxidized layers; forming an insulating layer on the first and the second oxidized layers; forming a plurality of trenches on the array region, where the trenches pass through the first oxidized layer and the insulating layer on the first oxidized layer; forming a conductive layer on the side and base surfaces of each trench; removing a portion of the conductive layer and a portion of the insulating layer to form a plurality of notches to expose the first oxidized layer; and removing the first oxidized layers which are exposed from the notches.
申请公布号 US2013203233(A1) 申请公布日期 2013.08.08
申请号 US201213461921 申请日期 2012.05.02
申请人 LEE TZUNG-HAN;HUANG CHUNG-LIN;CHU RON-FU;INOTERA MEMORIES, INC. 发明人 LEE TZUNG-HAN;HUANG CHUNG-LIN;CHU RON-FU
分类号 H01L21/02 主分类号 H01L21/02
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