发明名称 PLASMA PROCESSING DEVICE, AND PLASMA PROCESSING METHOD
摘要 <p>[Problem] To precisely suppress fluctuation and unevenness in a plasma process in one-time sheet plasma processing. [Solution] An OES measurement unit (110) outputs a spectroscopic measurement value (MOESi) at, or immediately after, the completion of each step. A CD estimation unit (140) uses the spectroscopic measurement value (MOESi) and a CD estimation model (AMi), introduced from an estimation model storage unit (142), to find a CD estimation value (ACDi) for each step. In the automatic control of a subject (130) to be controlled, a process control unit (132) uses, for the next step, the CD estimation value (ACDi) for the previous step, taken from the CD estimation unit (140), in addition to a process condition setting value (PCi+1), for the next-step, introduced from a recipe storage unit (136), and a process control model (CMi+1), for the next step, introduced from a control model storage unit (138).</p>
申请公布号 WO2013114870(A1) 申请公布日期 2013.08.08
申请号 WO2013JP00487 申请日期 2013.01.30
申请人 TOKYO ELECTRON LIMITED 发明人 AKIMOTO, TOSHIKAZU;KANNAN, HIROSHI
分类号 H01L21/3065;H01L21/205;H01L21/304;H05H1/00;H05H1/46 主分类号 H01L21/3065
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