| 摘要 |
<p>Provided is a sample fixing member for a time-of-flight secondary ion mass spectrometer, capable of preventing contamination of a solid sample, capable of stably fixing the solid sample, and capable of accurately detecting secondary ions in a time-of-flight secondary ion mass spectrometer. This sample fixing member for a time-of-flight secondary ion mass spectrometer includes a fibrous columnar structure comprising a plurality of fibrous columnar objects having a length of at least 200 µm.</p> |
