发明名称 |
METHOD OF REDUCING SURFACE DOPING CONCENTRATION OF DOPED DIFFUSION REGION, METHOD OF MANUFACTURING SUPER JUNCTION USING THE SAME AND METHOD OF MANUFACTURING POWER TRANSISTOR DEVICE |
摘要 |
The present invention provides a method of reducing a surface doping concentration of a doped diffusion region. First, a semiconductor substrate is provided. The semiconductor substrate has the doped diffusion region disposed therein, and the doped diffusion region is in contact with a surface of the semiconductor substrate. A doping concentration of the doped diffusion region close to the surface is larger than a doping concentration of the doped diffusion region away from the surface. Then, a thermal oxidation process is performed to form an oxide layer on the surface of the semiconductor substrate. A part of the doped diffusion region in contact with the surface reacts with oxygen to form a part of the oxide layer. Then, the oxide layer is removed.
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申请公布号 |
US2013203229(A1) |
申请公布日期 |
2013.08.08 |
申请号 |
US201213537080 |
申请日期 |
2012.06.29 |
申请人 |
LIN YUNG-FA;HSU SHOU-YI;WU MENG-WEI;CHANG CHIA-HAO |
发明人 |
LIN YUNG-FA;HSU SHOU-YI;WU MENG-WEI;CHANG CHIA-HAO |
分类号 |
H01L21/336;H01L21/322 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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