发明名称 METHOD OF REDUCING SURFACE DOPING CONCENTRATION OF DOPED DIFFUSION REGION, METHOD OF MANUFACTURING SUPER JUNCTION USING THE SAME AND METHOD OF MANUFACTURING POWER TRANSISTOR DEVICE
摘要 The present invention provides a method of reducing a surface doping concentration of a doped diffusion region. First, a semiconductor substrate is provided. The semiconductor substrate has the doped diffusion region disposed therein, and the doped diffusion region is in contact with a surface of the semiconductor substrate. A doping concentration of the doped diffusion region close to the surface is larger than a doping concentration of the doped diffusion region away from the surface. Then, a thermal oxidation process is performed to form an oxide layer on the surface of the semiconductor substrate. A part of the doped diffusion region in contact with the surface reacts with oxygen to form a part of the oxide layer. Then, the oxide layer is removed.
申请公布号 US2013203229(A1) 申请公布日期 2013.08.08
申请号 US201213537080 申请日期 2012.06.29
申请人 LIN YUNG-FA;HSU SHOU-YI;WU MENG-WEI;CHANG CHIA-HAO 发明人 LIN YUNG-FA;HSU SHOU-YI;WU MENG-WEI;CHANG CHIA-HAO
分类号 H01L21/336;H01L21/322 主分类号 H01L21/336
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