| 摘要 |
<p>Microscope (100) with at least one illumination beam path (2) and at least one detection beam path (5) comprises a focussing arrangement (3) for each illumination beam path for producing an extended planar object illumination region in the direction of and perpendicular to an illumination axis of the illumination beam path. A detection device (10) of the detection beam path is arranged approximately orthogonally to the planar object illumination region. A movement arrangement is provided for producing relative movement between the planar object illumination region and an object (4) to be investigated. Independent claims are also included for alternative microscopes.</p> |
