发明名称 METHOD OF READING DATA IN A NONVOLATILE MEMORY DEVICE
摘要 PURPOSE: A data reading method of a non-volatile memory device is provided to read accurate data with one read retry even when a read fails by determining an optimal read voltage level according to the number of on-cells (or off-cells) among monitoring cells. CONSTITUTION: A first read operation is performed to read data by applying a first read voltage having a first read voltage level to monitoring cells programmed to make data have programmed data cells and predetermined threshold voltages (S110). It is confirmed that a read fails in the first read operation (S130). A second read voltage level is determined according to the number of on-cells having threshold voltages in a voltage level lower than the first read voltage level among the monitoring cells when the read fails (S150). A second read operation is performed by applying a second read voltage having the second read voltage level to the data cells (S170). [Reference numerals] (AA) Start; (BB) No; (CC) Yes; (DD) Start; (S110) Perform a first read operation by applying a first read voltage having a first read voltage level to data cells and monitoring cells; (S130) Read fails?; (S150) Determine a second read voltage according to the number of on-cells among the monitoring cells; (S170) Perform a second read operation by applying a second read voltage having the second read voltage level to the data cells
申请公布号 KR20130087737(A) 申请公布日期 2013.08.07
申请号 KR20120008824 申请日期 2012.01.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, CHUL HO
分类号 G11C16/26;G11C16/34 主分类号 G11C16/26
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