| 摘要 |
The X-ray apparatus has X-ray detector (30) with detector elements (32) to detect intensity of incident x-ray radiation. An X-ray optic array (34) provided between inspection object (12) and detector elements has several X-ray optics (36) which are arranged so that inspection object on one of the X-ray optics impinging several X-ray radiation is projected onto detector elements. An evaluation unit is provided to evaluate detected intensities, so that intensity of x-ray radiation emanating from volume element (18) of object is detected for several volume elements of the object. An independent claim is included for method for inspecting to-be-examined three-dimensional object. |
