发明名称 |
Methods for forming a plurality of contact holes in a microelectronic device |
摘要 |
A method including: forming a dielectric layer over a substrate of a microelectronic device; forming a photoresist layer over the dielectric layer; performing a first exposure of the photoresist layer to permit portions of the dielectric layer to be removed at a first plurality of locations; subsequent to performing the first exposure, performing a second exposure of the photoresist layer to permit portions of the dielectric layer to be removed at a second plurality of locations different from the first plurality of locations; removing the portions of the dielectric layer at each of i) the first plurality of locations and ii) the second plurality of locations; and etching the dielectric layer at each of i) the first plurality of locations and ii) the second plurality of locations to respectively form a contact hole at each of the i) the first plurality of locations and ii) the second plurality of locations.
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申请公布号 |
US8501619(B1) |
申请公布日期 |
2013.08.06 |
申请号 |
US201113212065 |
申请日期 |
2011.08.17 |
申请人 |
WU ALBERT;WEI CHIEN-CHUAN;MARVELL INTERNATIONAL LTD. |
发明人 |
WU ALBERT;WEI CHIEN-CHUAN |
分类号 |
H01L21/47 |
主分类号 |
H01L21/47 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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