发明名称 Methods for forming a plurality of contact holes in a microelectronic device
摘要 A method including: forming a dielectric layer over a substrate of a microelectronic device; forming a photoresist layer over the dielectric layer; performing a first exposure of the photoresist layer to permit portions of the dielectric layer to be removed at a first plurality of locations; subsequent to performing the first exposure, performing a second exposure of the photoresist layer to permit portions of the dielectric layer to be removed at a second plurality of locations different from the first plurality of locations; removing the portions of the dielectric layer at each of i) the first plurality of locations and ii) the second plurality of locations; and etching the dielectric layer at each of i) the first plurality of locations and ii) the second plurality of locations to respectively form a contact hole at each of the i) the first plurality of locations and ii) the second plurality of locations.
申请公布号 US8501619(B1) 申请公布日期 2013.08.06
申请号 US201113212065 申请日期 2011.08.17
申请人 WU ALBERT;WEI CHIEN-CHUAN;MARVELL INTERNATIONAL LTD. 发明人 WU ALBERT;WEI CHIEN-CHUAN
分类号 H01L21/47 主分类号 H01L21/47
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