发明名称 Method of manufacturing semiconductor device having silicon carbide layers containing phosphorus
摘要 A semiconductor device includes a MOS transistor, a source electrode and a drain electrode on the MOS transistor each include a first carbon doped silicon layer including carbon at a first carbon concentration and phosphorus at a first phosphorus concentration and a second carbon doped silicon layer over the first silicon carbide layer, which includes phosphorus at a second phosphorus concentration higher than the first phosphorus concentration, and which includes carbon at a second carbon concentration less than or equal to the first carbon concentration.
申请公布号 US8501571(B2) 申请公布日期 2013.08.06
申请号 US201213419713 申请日期 2012.03.14
申请人 TAMURA NAOYOSHI;FUJITSU SEMICONDUCTOR LIMITED 发明人 TAMURA NAOYOSHI
分类号 H01L21/336;H01L21/00;H01L21/20;H01L21/36;H01L21/8238;H01L27/088;H01L33/00 主分类号 H01L21/336
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