发明名称 Method and apparatus for determining within-die and across-die variation of analog circuits
摘要 Described herein is the method and apparatus for determining frequency of an oscillator coupled with one or more analog devices, and for determining within-die or across-die variations in an analog property associated with the one or more analog devices, the determining based on the oscillator frequency. The analog property includes output signal swing, bandwidth, offset, gain, and delay line linearity and range. The one or more analog devices include input-output (I/O) buffer, analog amplifier, and delay line. The method further comprises updating a simulation model file based on the determining of the within-die and/or across-die variations of the analog property.
申请公布号 US8502612(B2) 申请公布日期 2013.08.06
申请号 US201113197525 申请日期 2011.08.03
申请人 MOSALIKANTI PRAVEEN;KURD NASSER A.;WILSON TIMOTHY M.;INTEL CORPORATION 发明人 MOSALIKANTI PRAVEEN;KURD NASSER A.;WILSON TIMOTHY M.
分类号 G01R23/02;G01R27/00;H03K3/03 主分类号 G01R23/02
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