发明名称 METHOD AND DEVICE FOR ESTIMATING DAMAGE TO A MAGNETIC TUNNEL JUNCTION (MTJ) ELEMENT
摘要 A method of estimating damage to a magnetic tunnel junction (MTJ) element that includes providing an MTJ element having a magnetic barrier layer, the magnetic barrier layer having a periphery, a cross-sectional area and a thickness and comprising an inner region of undamaged magnetic barrier material and an outer region of damaged magnetic barrier material between the inner region and the periphery, determining a first value indicative of an electrical characteristic of the MTJ element, determining a second value indicative of the electrical characteristic that the MTJ element would have had if the outer region of damaged magnetic barrier material were not present and if the inner region of undamaged magnetic barrier material extended to the periphery, and calculating a value indicative of the size of the outer region of damaged magnetic barrier material from the first value and the second value. Also a computer configured to perform the method.
申请公布号 WO2013112766(A2) 申请公布日期 2013.08.01
申请号 WO2013US23028 申请日期 2013.01.24
申请人 QUALCOMM INCORPORATED 发明人 LI, XIA;CHEN, WEI-CHUAN;KANG, SEUNG H.
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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