| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection method which can accurately detect a defect, such as a foreign material on an optical film and a defect due to a small change in film thickness around the foreign matter, can handle an inspected optical film as a product and is performed by efficient visual observation.SOLUTION: An inspection method determines the existence/absence of abnormality of reflected light by irradiating a light source with light from one surface side of an optical film having a transparent optical function layer on the one surface of the film while the other surface of the optical film is brought into close contact with a metal stage member through a transparent liquid layer. |
