| 摘要 |
According to the invention, a parameter, which is used as a constraint condition in an optimum solution search process, is given, as examination area definition information, to an image examination apparatus. Then, during examination of a to-be-examined object, the image examination apparatus uses, as the constraint condition, the examination area definition information to determine an optimum solution of examination area in an image of the to-be-examined object. In this way, for each of a plurality of to-be-examined objects, the position and shape of a respective examination area are determined. |
