| 摘要 |
PROBLEM TO BE SOLVED: To provide a sample observation method capable of accurately observing a macroscopic dispersion state of a sample comprising a material having a dual-phase structure in which a second phase is dispersed in a parent phase, in terms of a specific phase of the second phase that affects quality of the material.SOLUTION: Provided is a sample observation method for observing, for a sample having a dual-phase structure in which a second phase having a minute internal structure is dispersed in a parent phase, a state of the second phase having a minute internal structure. The sample observation method includes a dispersion state observation step of obtaining a reflection electron image of the sample under the condition where an accelerating voltage is 7kV or more and a capturing angle is 60° or more by using a scanning electron microscope, and observing a dispersion state of the second phase having a minute internal structure. |
