发明名称 STRUCTURE OF ELECTRICAL CONTACT AND FABRICATION METHOD THEREOF
摘要 A method of fabricating an electrical contact comprises the following steps. A substrate having at least a silicon region is provided. At least an insulation layer is formed on the substrate, wherein the insulation layer comprises at least a contact hole which exposes the silicon region. A metal layer is formed on sidewalls and bottom of the contact hole. An annealing process is performed to form a first metal silicide layer in the silicon region nearby the bottom of the contact hole. A conductive layer covering the metal layer and filling up the contact hole is then formed, wherein the first metal silicide layer is transformed into a second metal silicide layer when the conductive layer is formed.
申请公布号 US2013193577(A1) 申请公布日期 2013.08.01
申请号 US201213364289 申请日期 2012.02.01
申请人 TSENG I-MING;TSAI TSUNG-LUNG;CHEN YI-WEI 发明人 TSENG I-MING;TSAI TSUNG-LUNG;CHEN YI-WEI
分类号 H01L23/532;H01L21/768;H01L23/522 主分类号 H01L23/532
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