| 摘要 |
PROBLEM TO BE SOLVED: To provide test set-up and test method for non-destructive detection of a flaw in a device under test by means of an eddy current, with increased analysis accuracy.SOLUTION: A test set-up (10) for non-destructive detection of a flaw in a device under test by means of an eddy current comprises: an excitation coil (14), to which an excitation signal (SE) can be provided to act on the device under test (16) with an electromagnetic alternating magnetic field; a receiving coil (17) to generate a coil signal (SP), which is a function of the flaw in the device under test (16); an analog-digital converter (21), which is coupled to the receiving coil (17) on the input side; a filter arrangement (22), which is coupled to the analog-digital converter (21) on the input side and is designed for band-pass filtering and scanning frequency reduction; and a demodulator (27), which is coupled to an output of the filter arrangement (22) on the input side. |
