发明名称 SRAM WITH HYBRID FINFET AND PLANAR TRANSISTORS
摘要 An SRAM structure and method which includes a semiconductor on insulator (SOI) substrate which includes a semiconductor substrate, an insulating layer and a semiconductor on insulator (SOI) layer. The SOI layer has a first thickness. The SRAM structure further includes a FinFET transistor formed on the SOI substrate including a first defined portion of the SOI layer of the first thickness forming an active layer of the FinFET transistor and a gate dielectric on the first defined portion of the SOI layer and a planar transistor formed on the SOI substrate including a second defined portion of the SOI layer of a second thickness forming an active layer of the planar transistor and a gate dielectric on the second defined portion of the SOI layer. The first thickness is greater than the second thickness. Also included is a gate electrode on the FinFET transistor and the planar transistor.
申请公布号 US2013193515(A1) 申请公布日期 2013.08.01
申请号 US201213359454 申请日期 2012.01.26
申请人 CHENG KANGGUO;HAENSCH WILFRIED E.-A.;KHAKIFIROOZ ALI;KULKARNI PRANITA;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHENG KANGGUO;HAENSCH WILFRIED E.-A.;KHAKIFIROOZ ALI;KULKARNI PRANITA
分类号 H01L27/12;H01L21/28 主分类号 H01L27/12
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