发明名称 Memory Cell Structures and Memory Arrays
摘要 Some embodiments include memory cell structures. The structures include a vertical transistor having a bottom source/drain region electrically coupled to a first access/sense line, and having a gate comprised by a second access/sense line. The structures also include programmable material over the vertical transistor and electrically coupled with a top source/drain region of the vertical transistor, with the programmable material having at least two compositionally different regions. The structures also include an electrically conductive material over and directly against the programmable material. Some embodiments include memory arrays.
申请公布号 US2013193400(A1) 申请公布日期 2013.08.01
申请号 US201213359715 申请日期 2012.01.27
申请人 SANDHU GURTEJ S.;ZAHURAK JOHN K.;MICRON TECHNOLOGY, INC. 发明人 SANDHU GURTEJ S.;ZAHURAK JOHN K.
分类号 H01L45/00 主分类号 H01L45/00
代理机构 代理人
主权项
地址