| 摘要 |
PROBLEM TO BE SOLVED: To provide a projection system capable of inspecting a defect of an inspection object even when the inspection object has a diffusion surface.SOLUTION: A projection system 1 provided with an irradiation device 10 for irradiating an inspection object 2 with light to project transmitted light from the inspection object 2 to a photographing device 14 includes a magnification projection optical unit 12 having a focal point at an inspection place R of the inspection object 2 to project an image of the inspection place R to the photographing device 14 on the basis of the transmitted light from the inspection object 2. |
