发明名称 Apparatus and method for testing multiple integrated circuit devices on a film frame handler
摘要 Film frame assemblies and apparatus for testing and singulating integrated circuit packages, as well as associated methods for forming a film frame assembly, and testing and singulating integrated circuit packages are disclosed. A plurality of leads on a lead frame are cut to form singulated integrated circuit packages. Apparatus and methods are disclosed for mechanically aligning a set of electrical contacts attached to a contactor body with a plurality of leads on a singulated integrated circuit package.
申请公布号 US8497697(B2) 申请公布日期 2013.07.30
申请号 US20100815174 申请日期 2010.06.14
申请人 BLANEY GERARD;ANALOG DEVICES, INC. 发明人 BLANEY GERARD
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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