发明名称 TESTING APPARATUS AND TEST HEAD
摘要 PROBLEM TO BE SOLVED: To easily load a mother board onto a test head of a tester. SOLUTION: This tester is equipped with the test head having a pin card built therein for transferring signals between itself and a device under test, and the mother board mounted on the test head for electrically connecting the pin card to the device. The test head comprises a test head-side guide part and a mounting/demounting part. The guide part holds the mother board on an upper surface of the test head slidably in a predetermined moving direction substantially parallel to the upper surface. The mounting/demounting part connects a mother board-side connector to a corresponding pin card-side connector by moving the mother board to the test head-side in a state where the mother board-side connector provided on a lower part of the mother board is moved, owing to the slid mother board, to a position confronting the pin card-side connector provided on an upper side edge of the test head on the pin card. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 KR101290952(B1) 申请公布日期 2013.07.29
申请号 KR20060093384 申请日期 2006.09.26
申请人 发明人
分类号 G01R31/26;G01R31/319;H01L21/66 主分类号 G01R31/26
代理机构 代理人
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