发明名称 ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT
摘要 PURPOSE: An electrostatic discharge protection circuit is provided to improve long-term reliability of an integrated circuit by operating not to directly apply high voltage to a middle gate oxide film transistor. CONSTITUTION: Two stack transistors (MVN5,MVN6) are connected to a first power line (L1) and a ground line in series. A first resistor (Res1) is connected between the first power line and a first node. A first transistor (MVN1) and a capacitor (EGC1) are connected between the first node and the ground line in series. A second transistor (MVP1) is connected between a second power line and a second node, and a gate thereof is connected to the ground line. An inverter (MVP3,MVN2) is connected to a third node and the ground line and an input thereof is connected to the second node. A fourth transistor is connected to the first power line, and a gate thereof is connected to the second node.
申请公布号 KR20130084934(A) 申请公布日期 2013.07.26
申请号 KR20120005909 申请日期 2012.01.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEON, CHAN HEE;KIM, DOO HYUNG;KIM, HAN GU;SEO, WOO JIN;LEE KI TAE;LIM, HONG WOOK
分类号 H01L27/04 主分类号 H01L27/04
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