发明名称 |
ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT |
摘要 |
PURPOSE: An electrostatic discharge protection circuit is provided to improve long-term reliability of an integrated circuit by operating not to directly apply high voltage to a middle gate oxide film transistor. CONSTITUTION: Two stack transistors (MVN5,MVN6) are connected to a first power line (L1) and a ground line in series. A first resistor (Res1) is connected between the first power line and a first node. A first transistor (MVN1) and a capacitor (EGC1) are connected between the first node and the ground line in series. A second transistor (MVP1) is connected between a second power line and a second node, and a gate thereof is connected to the ground line. An inverter (MVP3,MVN2) is connected to a third node and the ground line and an input thereof is connected to the second node. A fourth transistor is connected to the first power line, and a gate thereof is connected to the second node. |
申请公布号 |
KR20130084934(A) |
申请公布日期 |
2013.07.26 |
申请号 |
KR20120005909 |
申请日期 |
2012.01.18 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JEON, CHAN HEE;KIM, DOO HYUNG;KIM, HAN GU;SEO, WOO JIN;LEE KI TAE;LIM, HONG WOOK |
分类号 |
H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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