发明名称 |
DIMPLE INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME |
摘要 |
PURPOSE: A dimple inspecting system and an inspecting method using the same are provided to increase the effectiveness of inspection by determining a defect without breaking an inspecting object. CONSTITUTION: An optical source illuminates light to a sample. An imaging part (130) receives reflection light. A control part (120) performs control. A display part (125) is connected to the control part. The display part displays inspection information for the sample. [Reference numerals] (120) Control unit
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申请公布号 |
KR20130084890(A) |
申请公布日期 |
2013.07.26 |
申请号 |
KR20120005815 |
申请日期 |
2012.01.18 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
TAE, WON HWA;HWANG, JOONG MO |
分类号 |
H05K13/08;G01B11/24;H05K3/00 |
主分类号 |
H05K13/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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