发明名称 DIMPLE INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME
摘要 PURPOSE: A dimple inspecting system and an inspecting method using the same are provided to increase the effectiveness of inspection by determining a defect without breaking an inspecting object. CONSTITUTION: An optical source illuminates light to a sample. An imaging part (130) receives reflection light. A control part (120) performs control. A display part (125) is connected to the control part. The display part displays inspection information for the sample. [Reference numerals] (120) Control unit
申请公布号 KR20130084890(A) 申请公布日期 2013.07.26
申请号 KR20120005815 申请日期 2012.01.18
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 TAE, WON HWA;HWANG, JOONG MO
分类号 H05K13/08;G01B11/24;H05K3/00 主分类号 H05K13/08
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