,申请号JP20130509581-传众专利搜索

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发明名称
摘要	The present invention relates to a method for covering Atomic Force Microscopy (AFM) tips by depositing a material in the form of nanoparticles with an aggregate source.
申请公布号	JP2013530390(A)	申请公布日期	2013.07.25
申请号	JP20130509581	申请日期	2011.05.04
申请人		发明人
分类号	G01Q60/42	主分类号	G01Q60/42
代理机构		代理人
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